In-situ Stretchable Probe System

The In-situ Stretchable Probe System enables precise electrical characterization of stretchable substrates, eliminating variability from clamping pressure. Designed for high-accuracy testing, it operates at up to 450°C without a cooling unit and ensures stable contact during expansion and return cycles. Furthermore, the system allows real-time measurement of FET device characteristics, synchronized with the expansion and return of the stretchable substrate.

Key Features
Precision probing	Maintains stable contact without clamping pressure
High-temperature capability	Operates at up to 450°C for extended periods
Dynamic testing	Supports in-situ expansion and return experiments
Real-time FET analysis	Captures electrical characteristics during substrate stretching

Effective stroke	10 – 30 mm
Maximum sample width	80 mm
Maximum stretching speed	10 mm/s
Cycle repeatability	10 μm
Maximum tensile force	3 kgf
Force meter resolution	5 gf
Window *	Ø 43 mm (Fused Silica)
Number of Probes **	4
Probe Module	Smart Tracking Probe
Probe Module Stroke (X-Axis)	12 mm
Probe Tip	Nextron 1k Probe
Probe Tip Diameter	250 µm
Maximum DC Voltage	300 V
Maximum Current	1000 mA
Maximum Frequency	300 MHz (< 3 dB)

* For comprehensive information on windows, please refer to the window selection guide for optical covers.
** Customization is available for the number of probes.

Dimension

(Unit: mm)

Top	3D
Front	Right

Video

Technical Data