Stretchable System

In-situ Stretchable Probe System

The In-situ Stretchable Probe System enables precise electrical characterization of stretchable substrates, eliminating variability from clamping pressure. Designed for high-accuracy testing, it operates at up to 450°C without a cooling unit and ensures stable contact during expansion and return cycles. Furthermore, the system allows real-time measurement of FET device characteristics, synchronized with the expansion and return of the stretchable substrate.

Key Features
Precision probing Maintains stable contact without clamping pressure
High-temperature capability Operates at up to 450°C for extended periods
Dynamic testing Supports in-situ expansion and return experiments
Real-time FET analysis Captures electrical characteristics during substrate stretching
Effective stroke 10 – 30 mm
Maximum sample width 80 mm
Maximum stretching speed 10 mm/s
Cycle repeatability 10 μm
Maximum tensile force 3 kgf
Force meter resolution 5 gf
Window * Ø 43 mm (Fused Silica)
Number of Probes ** 4
Probe Module Smart Tracking Probe
Probe Module Stroke (X-Axis) 12 mm
Probe Tip Nextron 1k Probe
Probe Tip Diameter 250 µm
Maximum DC Voltage 300 V
Maximum Current 1000 mA
Maximum Frequency 300 MHz (< 3 dB)

* For comprehensive information on windows, please refer to the window selection guide for optical covers.
** Customization is available for the number of probes.

Dimension

(Unit: mm)
Top 3D
Stretchable's dimension top view
Stretchable's dimension 3D view
Front Right
Stretchable's dimension front view
Stretchable's dimension right view

Video

Video of a Nextron 1k probe moving along with a PDMS sample during stretching.

Technical Data

StretchingTest

Figure. An example of measuring the voltage change according to the elongation rate for a sample that is stretchable with SPS.