The In-situ Stretchable Probe System enables precise electrical characterization of stretchable substrates, eliminating variability from clamping pressure. Designed for high-accuracy testing, it operates at up to 450°C without a cooling unit and ensures stable contact during expansion and return cycles. Furthermore, the system allows real-time measurement of FET device characteristics, synchronized with the expansion and return of the stretchable substrate.
Key Features | |
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Precision probing | Maintains stable contact without clamping pressure |
High-temperature capability | Operates at up to 450°C for extended periods |
Dynamic testing | Supports in-situ expansion and return experiments |
Real-time FET analysis | Captures electrical characteristics during substrate stretching |
Effective stroke | 10 – 30 mm |
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Maximum sample width | 80 mm |
Maximum stretching speed | 10 mm/s |
Cycle repeatability | 10 μm |
Maximum tensile force | 3 kgf |
Force meter resolution | 5 gf |
Window * | Ø 43 mm (Fused Silica) |
Number of Probes ** | 4 |
Probe Module | Smart Tracking Probe |
Probe Module Stroke (X-Axis) | 12 mm |
Probe Tip | Nextron 1k Probe |
Probe Tip Diameter | 250 µm |
Maximum DC Voltage | 300 V |
Maximum Current | 1000 mA |
Maximum Frequency | 300 MHz (< 3 dB) |
* For comprehensive information on windows, please refer to the window selection guide for optical
covers.
** Customization is available for the number of probes.
Top | 3D |
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Front | Right |
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Video of a Nextron 1k probe moving along with a PDMS sample during stretching.
Figure. An example of measuring the voltage change according to the elongation rate for a sample that is stretchable with SPS.