Micro Probe System for Thermoelectric
Devices (Dual Peltier Model)
Dual Peltier micro probe system enabling temperature differential measurements using two independent sample stages.
Temperature Range |
-40 – 200 °C |
Max. Ramping Rate |
60 °C/ |
Temperature Accuracy |
±0.1 °C |
Temp Resolution |
±0.1 °C |
Stage size |
19 × 16 mm |
Adjustable Gap |
0 ~ 3 mm |
Stage transmission hole |
Ø 2 mm |
Temperature Range |
-40 ~ 200 °C |
Stage Material |
Rhodium coated copper |
Window * |
Ø 43 mm (Fused Silica)
|
Number of Probes in Standard Chamber
|
4 |
Probe Module |
Smart Tracking Probe |
Probe Module Stroke (X-Axis) |
12 mm |
Probe Tip |
Tungsten Probe |
Probe Tip Diameter |
50 or 100 µm |
Vacuum Test |
< 10E-3 mbar at RT (With Rotary Pump)
|
< 10E-5 mbar at RT (With Turbo Pump)
|
Vacuum & Vent Line Fitting |
Basic |
1/4, 1/8" Swagelok Tube Fitting |
Optional |
NW16 |
Leakage Current |
< 100 pA (Coaxial)
|
< 100 fA (Triaxial)
|
Maximum DC Voltage |
300 V |
Maximum Current |
1000 mA |
Maximum Frequency
|
300 MHz (< 3 dB)
|
* For comprehensive information on windows, please refer to the window selection guide for optical
covers.
Dimension
(Unit: mm)
Dimensions |
4ch |
W |
140 |
D |
70 |
H |
30.3 |
Technical Data