• XRD chamber: Nextron XRD Micro Probe System
• Sample: SrFe0.8Co0.2O2.5 on 001 SrTiO3
• Beam line: Pohang Accelerator Laboratory 3D beam line
• Measurement: Real-time XRD and resistance measurements in supply of N2 (2.5 hrs), O2 (6 hrs), and N2 (2.5 hrs) in sequence. Flow rate was 20 sccm.
• Results: The lattice constant of SrFe0.8Co0.2O2.5 thin film shifted sequentially to 3.99 Å (N2), 3.90 Å (O2), and 4.00 Å (N2). Associated resistance changes is observed due to topotactic transformations.
This research work is supported by 'Busan Open Laboratory Business Meeting Market Demands' project.
Figure. Integrated in-plane microheater’s (a) temperature variations in terms of the applied DC bias voltages, (b) repeatability at 180 °C, (c) sensitivity and linearity, and (d) surface temperature analysis by a thermal imaging camera at 8 V DC bias.
Measured while purging hydrogen and nitrogen mixed gas without using vacuum pump Sample: Palladium coated Zinc oxide(ZnO/Al2O3) nanowire for hydrogen gas sensing.
This data was contributed by Nextron's partner, Weve.
Micro Probe System is perfectly compatible with Weve's products.
Vanadium dioxide(VO2) nanowire Study of phase transition by temperature
Figure. Transmittance hysteresis curves at wavelength of 2000 nmfor (a) thermal and (b) IPL sintered VO2 films. The temperature corresponding to themaximumof first-order derivative curves for (c) thermal and (d) IPL sintered VO2 films.
Figure. Temperature-dependent I–V characteristics for (a) the reference LED and (b) the self-protective LED under pulse operation.
The bridge voltage as function of pressure after an offset voltage correction at 100 kPa. The Wheatstone bridges connections to the SMU; schematically (left) and through microscope (right).
This data was contributed by Nextron’s partner, Polytec GmbH. Micro Probe System is used for Polytec’s products as their environmental chamber.
Figure (a) Top view of the sample used in electromigration test.
(b) A schematic overview of the electromigration measurement setup.
Figure. Electromigration results for 300 °C-deposited Al stripes under 1 MA cm−2 at 200 °C, 250 °C, 300 °C, and 350 °C at 10 h.
Single crystalline VO2 nanobeams Study of MIT (Metal-Insulator Transition)
Slide glass substrate Denaturation at 94 °C and annealing/extension at 59 °C