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8 probe Piezo-Driven probe

Piezo-Driven probe

Ultra compact piezo module

  • Module Speed
  • Stroke (X , Y axis)
  • Stroke (Z - axis)
  • Holding Force
  • Manipulate Dimension
  • Resolution
  • Chamber size
  • • Temp. Range
  • 5 mm /s
  • 8 mm
  • 3 mm
  • 250 gf ~ 300 gf
  • 20 x 20 x 30 mm
  • < 1 μm
  • Ø 230 x 50 mm
  • • CH (RT ~ +1000 °C)
  • • PT (-40 ~ +200 °C)
  • • LN (80 K ~ RT)
4 probe Piezo-Driven probe

Piezo-Driven probe

Ultra compact piezo module

  • Module Speed
  • Stroke (X , Y axis)
  • Stroke (Z - axis)
  • Holding Force
  • Manipulate Dimension
  • Resolution
  • Chamber size
  • • Temp. Range
  • 5 mm /s
  • 8 mm
  • 3 mm
  • 250 gf ~ 300 gf
  • 20 x 20 x 30 mm
  • < 1 μm
  • 180 x 99 x 28.5 mm
  • • CH (RT ~ +1000 °C)
  • • PT (-40 ~ +200 °C)
  • • LN (80 K ~ RT)
The Vertical Raman Electrochemical Reactor Cell

Micro Probe System for THz Signal Transmittance Measurement

Ultra compact piezo module

This probe system is perfectly suited for terahertz transmission experiments. It features a temperature-controlled sample holder with dual transmission apertures. It allows for simultaneous comparative analysis of test and reference samples. The unique Nextron probe ensures stable electrical probing and sample fixation, even in vertical orientations.

In-situ Raman Battery Test Cell

In-situ Raman Battery Test Cell

Ultra compact piezo module

In-situ Raman battery cell is capable of measuring the Raman spectrum of the cross-section of a battery sample. The In-situ Raman battery cell is developed for the in-situ study of the interface between layers such as anode, cathode, and separator. It is available to measure in-situ Raman not only liquid electrolyte batteries but also solid-state batteries. The product has a feature that can easily inject a liquid electrolyte and simple preparation of test samples.

For in-situ XRD Measurements

For in-situ XRD Measurements

Ultra compact piezo module

  • • Apply electric field
  • • Control temperature
  • • Control vacuum/gas
Probe Head Chamber equipped with Pogo Pin

Probe Head Chamber equipped with Pogo Pin

Ultra compact piezo module

  • Custom-made Probe Head
  • • No. of Pins
  • • Position of Pins
  • • Shape of Probe head
  • • Size of Sample Stage
Optical window stage chamber for integrated electro-optical experiments

Optical window stage chamber for integrated electro-optical experiments

SPM(scanning probe microscopy)Thermal Stage

SPM
(scanning probe microscopy)
Thermal Stage

Ultra compact piezo module

  • Max. temp.
  • Temperature range
  • Max. Ramping Rate
  • Accuracy
  • Stage Size
  • Stage material
  • 150 °C
  • 20 °C ~ 150 °C
  • 30 °C/min
  • ±0.1 °C
  • Ø 18 mm
  • Au coated Cu
SPM(scanning probe microscopy)Thermal Stage

SPM
(scanning probe microscopy)
Probe System

Ultra compact piezo module

  • Max. temp.
  • Temperature range
  • Max. Ramping Rate
  • Accuracy
  • Stage Size
  • Stage material
  • 150 °C
  • -30 °C ~ 150 °C
  • 30 °C/min
  • ±0.1 °C
  • 16 × 16 mm
  • Peliter
4 probe Peltier type sample stage

Peltier type sample stage

The system features an active cooling system that maintains the same heating and cooling rates.

  • Temp.
  • Sample stage size
  • Stage material
  • -40 ~ +200 °C
  • 19 x 19 mm
  • Special alloy coated copper
6 probe Peltier type sample stage with hole

Peltier type sample stage with hole

Experiments such as transmittance measurements are possible through the hole.

  • Temp.
  • Sample stage size
  • Stage material
  • -40 ~ +170 °C
  • 16 x 16 mm
  • Special alloy coated copper
4 probe Ceramic heater sample stage

Ceramic heater sample stage

The equipment is capable of measuring without a cooling unit for one hour at 450 °C.

  • Temp.
  • Sample stage size
  • Stage material
  • RT ~ +450 °C
  • Ø 1/2 inch
  • Alumina sample stage
6 probe Ceramic heater sample stage For high temperature

Ceramic heater sample stage

  • Temp.
  • Sample stage size
  • Stage material
  • RT ~ +750 °C / RT ~ +1000 °C
  • Ø 1/2 inch
  • AlN
Liquid Nitrogen sample stage

Nitrogen sample stage

  • Temp.
  • Sample stage size
  • Stage material
  • 80 K ~ RT
  • Ø 14 mm
  • Cu sample stage
13 probe ceramic sample satge thumbnail
13-Channel Micro Probe System(CH model)

13-Channel Micro Probe System

10-Channel Micro Probe System(LN model)

10-Channel Micro Probe System

For LCC Chip carrier (PT model)

For LCC Chip carrier

The stage is a leadless chip carrier socket, it is possible to mount the LCC chip carrier and conduct experiments under various environmental changes.

6 Probe and 24 Pin Terminal Block(PT model)

6 Probe and 24 Pin Terminal Block

Customization is possible with various probe methods and various probe combinations.

RF Micro Probe System with GSG Probe(CH model)

RF Micro Probe System with GSG Probe

MAX frequency 40GHz.

Dual Stage Model

Dual Stage Model

For applications such as the Seebeck effect.

Micro Probe System for Field Emission Measurements

Micro Probe System for Field Emission Measurements

A slidable top anode and the metal stage are connected to the SMA feedthrough. 4 probes connectable to the device.

Temperature Probe

Temperature Probe

TC probe makes it possible to easily and quickly measure the temperature of a desired point.

MPS with Ready to Mount Treaded Hole

MPS with Ready to Mount Treaded Hole

The threaded holes allow mounting with the most preferred stage shape.